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ホーム > 品質管理 > オープン/ショートテスト

オープン/ショートテスト

VSS
  • To test the lower diode,which is connected to VSS,use the PMU to force a negative current of approximately-100μA.Set the lower test limit of the PMU to fail if the measured result is less than-1.5V to detect an open . Set the upper PMU limit to fail if the measured result is greater than -0.2V to detect a short. This test method is used to test signal pins (inputs an outputs) but not power pins such as VDD or VSS.
  • Power and ground pins may also be tested for an open condition, but their structure is different from that of a signal pin. Test the power pins, observe the measured value on a good device, and set the test limits accordingly.
VDD
  • To test the upper diode, which is connected to VDD, use the PMU to force a positive current of approximately+100μA. Set the upper test limit of the PMU to fail if the measured result is greater than 1.5V to detected an open . Set the lower PMU limit to fail if the measured result is less than 0.2V to detect a short. This test method is used to test signal pins (inputs and outputs) but not power pins such as VDD or VSS.
 

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