- High Definition Appearance testing including Silk screen, coding, High Definition detect solder balls, which can detect whether oxidized or counterfeit parts.
- During a functional test the voltage level of the output signals from the DUT are compared to the VOL and VOH reference levels by the functional comparators. An output strobe is assigned a timing value for each output pin to control the exact point within the test cycle for sampling the output voltage.
- The opens/shorts test(also called continuity or contact test) verifies that, during a device test, electrical contact is made to all signal pins on the DUT and that no signal pin is shorted to another signal pin or power/ground.
- To exam the read,erase and program function as well as blank checking for chips including digital memory,Microcontrollers,MCU and so on
- X-RAY can confirm whether the wafer and wire bond and die bond is good or not ; the ROHS test is via the environmental protection of the product pin and lead content of the solder coating by the photovoltaic equipment
- Verify by chemical analysis whether the part is fake or refurbished
- IOT loT RF Performance Test Solution
- EMI pre-compatible (radiation) near - field measurement solution
- Low power measurement solution
- Wireless charging transmission efficiency measurement scheme