A new Atomic Force Microscope near electron counting
公開時間: 2018-12-14 サイズ: 557 Kb フォーマット: PDF ダウンロード: 31
A team of researchers have created a new Atomic Force Microscope with the help of Analog Devices electronics.
In particular, they measure the tiny currents produced by the piezoelectric effect with a transimpedance amplifier, which consists into a current-to-voltage converter. The work entitles “Piezo-generated charge mapping revealed through direct
piezoelectric force microscopy” published in the prestigious scientific journal Nature Communications.